Resources
Coulter LS13320
- Current Status: Up
The Coulter LS230 measures particle sizes from 40 nm to 2,000 µm by laser diffraction. It is based on the principle that particles scatter and diffract light at certain angles based on their size, shape, and optical properties. A 750 nm diode laser is used for analysis in the size range from 400 nm to 2 mm. The beam passes through filters as well as projection and Fourier lenses and is spatially recorded onto 126 photodiode detectors. The particle size, shape, and optical properties of the particles control the spatial variation of the diffracted beam. The calculations assume the scattering pattern is due to single scattering events by spherical particles. The advantages of this technique include ease of operation, large range of detectable particle sizes, and accuracy in the micron and submicron range. The Polarization Intensity Differential Scattering (PIDS) assembly sizes particles from 40 nm to 400 nm and improves resolution in the 400 nm to 800 nm range. PIDS uses a tungsten-halogen lamp and three sets of vertically and horizontally polarized color filters at 450, 600, and 900 nm as the light source. PIDS is based on the principle that at high scattering angles (~90 degrees) the difference in scattering intensity of the two polarizations is a sensitive function of the ratio of particle size to wavelength. The LS230 at the R&D Facility has three sample modules: a "large volume" fluid module, a 125 ml "small volume" fluid module, and a dry powder module. The wide dynamic range and ease of use make the LS230 the particle sizing "workhorse" of the R&D Facility.
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